A set of benchmarks for modular testing of SOCs

E.J. Marinissen; V. Iyengar; K. Chakrabarty

doi:10.1109/TEST.2002.1041802

A set of benchmarks for modular testing of SOCs

E.J. Marinissen, V. Iyengar, K. Chakrabarty

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

271 Citations (Scopus)

Abstract

This paper presents the ITC'02 SOC test benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.

Original language	English
Title of host publication	Proceedings of the International Test Conference 2002
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	519-528
ISBN (Print)	0-7803-7542-4
DOIs	https://doi.org/10.1109/TEST.2002.1041802
Publication status	Published - 2002
Externally published	Yes

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10.1109/TEST.2002.1041802

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@inbook{f5bb97eeb5774d9ea21d95deb87f7055,

title = "A set of benchmarks for modular testing of SOCs",

abstract = "This paper presents the ITC'02 SOC test benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.",

author = "E.J. Marinissen and V. Iyengar and K. Chakrabarty",

year = "2002",

doi = "10.1109/TEST.2002.1041802",

language = "English",

isbn = "0-7803-7542-4",

pages = "519--528",

booktitle = "Proceedings of the International Test Conference 2002",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

}

TY - CHAP

T1 - A set of benchmarks for modular testing of SOCs

AU - Marinissen, E.J.

AU - Iyengar, V.

AU - Chakrabarty, K.

PY - 2002

Y1 - 2002

N2 - This paper presents the ITC'02 SOC test benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.

AB - This paper presents the ITC'02 SOC test benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.

U2 - 10.1109/TEST.2002.1041802

DO - 10.1109/TEST.2002.1041802

M3 - Chapter

SN - 0-7803-7542-4

SP - 519

EP - 528

BT - Proceedings of the International Test Conference 2002

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

A set of benchmarks for modular testing of SOCs

Abstract

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