A set of benchmarks for modular testing of SOCs

E.J. Marinissen, V. Iyengar, K. Chakrabarty

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

252 Citations (Scopus)

Abstract

This paper presents the ITC'02 SOC test benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.
Original languageEnglish
Title of host publicationProceedings of the International Test Conference 2002
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages519-528
ISBN (Print)0-7803-7542-4
DOIs
Publication statusPublished - 2002
Externally publishedYes

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