A Self-calibrating current-steering 12-bit DAC based on new 1-bit self-test scheme

G.I. Radulov, P.J. Quinn, J.A. Hegt, Arthur Roermund, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Original languageEnglish
Title of host publicationProceedings of the IEEE IC Test Workshop 2004, 13-14 September 2004, Limerick, Ireland
Publication statusPublished - 2004

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