Orientational changes caused by the drawing of melt—crystallized ultra high molecular weight polyethylene (UHMW—PE) at 100 °C were studied at low draw ratios via wide—angle X—ray scattering (WAXS). In order to avoid possible relaxation and/or re—crystallization effects, a real—time WAXS study was performed during the drawing process. To reduce the X—ray exposure times, highly intense X—radiation from a synchrotron source was combined with a two—dimensional X—ray detector. The observed real—time WAXS patterns will be discussed.
|Title of host publication||Integration of Fundamental Polymer Science and Technology 2|
|Editors||L.A. Kleintjens, P.J. Lemstra|
|Place of Publication||London|
|Publisher||Elsevier Applied Science Publishers|
|Publication status||Published - 1988|