Abstract
Orientational changes caused by the drawing of melt—crystallized ultra
high molecular weight polyethylene (UHMW—PE) at 100 °C were studied at
low draw ratios via wide—angle X—ray scattering (WAXS). In order to
avoid possible relaxation and/or re—crystallization effects, a real—time
WAXS study was performed during the drawing process. To reduce the X—ray
exposure times, highly intense X—radiation from a synchrotron source was
combined with a two—dimensional X—ray detector. The observed real—time
WAXS patterns will be discussed.
| Original language | English |
|---|---|
| Title of host publication | Integration of Fundamental Polymer Science and Technology 2 |
| Editors | L.A. Kleintjens, P.J. Lemstra |
| Place of Publication | London |
| Publisher | Elsevier Applied Science Publishers |
| Pages | 423-430 |
| ISBN (Print) | 1-85166-208-1 |
| Publication status | Published - 1988 |