A new test program for lifetime arching stress withstand for high-voltage circuit-breakers

R.P.P. Smeets

A new test program for lifetime arching stress withstand for high-voltage circuit-breakers

R.P.P. Smeets

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 17th Conference on the Electric Power Supply Industry 2008 (EPSI)
Place of Publication	Macau, China
Publisher	EPSI
Publication status	Published - 2008
Event	conference; 17th Conference on the Electric Power Supply Industry, Macau, China; 2008-10-27; 2008-10-31 - Duration: 27 Oct 2008 → 31 Oct 2008

Conference

Conference	conference; 17th Conference on the Electric Power Supply Industry, Macau, China; 2008-10-27; 2008-10-31
Period	27/10/08 → 31/10/08
Other	17th Conference on the Electric Power Supply Industry, Macau, China

Cite this

@inproceedings{99cd0b5262ac4018b2be840539628bd6,

title = "A new test program for lifetime arching stress withstand for high-voltage circuit-breakers",

author = "R.P.P. Smeets",

year = "2008",

language = "English",

booktitle = "Proc. 17th Conference on the Electric Power Supply Industry 2008 (EPSI)",

publisher = "EPSI",

note = "conference; 17th Conference on the Electric Power Supply Industry, Macau, China; 2008-10-27; 2008-10-31 ; Conference date: 27-10-2008 Through 31-10-2008",

}

TY - GEN

T1 - A new test program for lifetime arching stress withstand for high-voltage circuit-breakers

AU - Smeets, R.P.P.

PY - 2008

Y1 - 2008

M3 - Conference contribution

BT - Proc. 17th Conference on the Electric Power Supply Industry 2008 (EPSI)

PB - EPSI

CY - Macau, China

T2 - conference; 17th Conference on the Electric Power Supply Industry, Macau, China; 2008-10-27; 2008-10-31

Y2 - 27 October 2008 through 31 October 2008

ER -