A new mechanism for high-frequency rectification at low temperatures in point contacts between identical metals

R.W. van der Heijden; A. G.M. Jansen; J. H.M. Stoelinga; H. M. Swartjes; P. Wyder

doi:10.1063/1.91841

A new mechanism for high-frequency rectification at low temperatures in point contacts between identical metals

R.W. van der Heijden
, A. G.M. Jansen
, J. H.M. Stoelinga
, H. M. Swartjes
, P. Wyder

Research output: Contribution to journal › Article › Academic › peer-review

21 Citations (Scopus)

Abstract

Experimental results are reported of high-frequency (∼ THz) radiation detection by metal-metal point contacts at low temperatures as a function of bias voltage. The dominant detection mechanism can be attributed to rectification due to electron-phonon-scattering-induced nonlinearity of the I-V characteristics, a process not observed before.

Original language	English
Pages (from-to)	245-248
Number of pages	4
Journal	Applied Physics Letters
Volume	37
Issue number	2
DOIs	https://doi.org/10.1063/1.91841
Publication status	Published - 1980
Externally published	Yes

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@article{58c79c7efd694cb28b0aa1fc22c413d9,

title = "A new mechanism for high-frequency rectification at low temperatures in point contacts between identical metals",

abstract = "Experimental results are reported of high-frequency (∼ THz) radiation detection by metal-metal point contacts at low temperatures as a function of bias voltage. The dominant detection mechanism can be attributed to rectification due to electron-phonon-scattering-induced nonlinearity of the I-V characteristics, a process not observed before.",

author = "\{van der Heijden\}, R.W. and Jansen, \{A. G.M.\} and Stoelinga, \{J. H.M.\} and Swartjes, \{H. M.\} and P. Wyder",

year = "1980",

doi = "10.1063/1.91841",

language = "English",

volume = "37",

pages = "245--248",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "2",

}

TY - JOUR

T1 - A new mechanism for high-frequency rectification at low temperatures in point contacts between identical metals

AU - van der Heijden, R.W.

AU - Jansen, A. G.M.

AU - Stoelinga, J. H.M.

AU - Swartjes, H. M.

AU - Wyder, P.

PY - 1980

Y1 - 1980

N2 - Experimental results are reported of high-frequency (∼ THz) radiation detection by metal-metal point contacts at low temperatures as a function of bias voltage. The dominant detection mechanism can be attributed to rectification due to electron-phonon-scattering-induced nonlinearity of the I-V characteristics, a process not observed before.

AB - Experimental results are reported of high-frequency (∼ THz) radiation detection by metal-metal point contacts at low temperatures as a function of bias voltage. The dominant detection mechanism can be attributed to rectification due to electron-phonon-scattering-induced nonlinearity of the I-V characteristics, a process not observed before.

UR - https://www.scopus.com/pages/publications/0242671723

U2 - 10.1063/1.91841

DO - 10.1063/1.91841

M3 - Article

SN - 0003-6951

VL - 37

SP - 245

EP - 248

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 2

ER -

A new mechanism for high-frequency rectification at low temperatures in point contacts between identical metals

Abstract

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