A Nanomechanical Testing Framework Yielding Front&Rear-Sided, High-Resolution, Microstructure-Correlated SEM-DIC Strain Fields

T. Vermeij, J.A.C. Verstijnen, T.J.J. Ramirez y Cantador, B. Blaysat, J. Neggers, J.P.M. Hoefnagels (Corresponding author)

Research output: Contribution to journal › Article › Academic › peer-review

19 Citations (Scopus)
128 Downloads (Pure)

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