A method to investigate the electron scattering characteristics of ultrathin metallic films by in situ electrical resistance measurements

I.G. Trindade, R. Fermento, D. Leitão, J.B. Sousa

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Abstract

In this article, a method to measure the electrical resistivity/ conductivity of metallic thin films during layer growth on specific underlayers is described. The in situ monitoring of an underlayer electrical resistance, its change upon the incoming of new material atoms/molecules, and the growth of a new layer are presented. The method is easy to implement and allows obtaining in situ experimental curves of electrical resistivity dependence upon film thickness with a subatomic resolution, providing insight in film growth microstructure characteristics, specular/diffuse electron scattering surfaces, and optimum film thicknesses.

Original languageEnglish
Article number073909
Number of pages6
JournalReview of Scientific Instruments
Volume80
Issue number7
DOIs
Publication statusPublished - Jul 2009
Externally publishedYes

Fingerprint

Dive into the research topics of 'A method to investigate the electron scattering characteristics of ultrathin metallic films by in situ electrical resistance measurements'. Together they form a unique fingerprint.

Cite this