A method for reliability optimization through degradation analysis and robust design

J.A. Bogaard, van den, J.S.R. Jayaram, A.C. Brombacher

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    24 Citations (Scopus)
    Original languageEnglish
    Title of host publication2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003
    Place of PublicationPiscataway
    PublisherInstitute of Electrical and Electronics Engineers
    Pages55-62
    ISBN (Print)0-8703-7717-6
    Publication statusPublished - 2003

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