| Original language | English |
|---|---|
| Title of host publication | 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003 |
| Place of Publication | Piscataway |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 55-62 |
| ISBN (Print) | 0-8703-7717-6 |
| Publication status | Published - 2003 |
Cite this
}
A method for reliability optimization through degradation analysis and robust design. / Bogaard, van den, J.A.; Jayaram, J.S.R.; Brombacher, A.C.
2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Piscataway : Institute of Electrical and Electronics Engineers, 2003. p. 55-62.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
TY - GEN
T1 - A method for reliability optimization through degradation analysis and robust design
AU - Bogaard, van den, J.A.
AU - Jayaram, J.S.R.
AU - Brombacher, A.C.
PY - 2003
Y1 - 2003
M3 - Conference contribution
SN - 0-8703-7717-6
SP - 55
EP - 62
BT - 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003
PB - Institute of Electrical and Electronics Engineers
CY - Piscataway
ER -