A method for reliability optimization through degradation analysis and robust design

J.A. Bogaard, van den, J.S.R. Jayaram, A.C. Brombacher

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    24 Citations (Scopus)
    Original languageEnglish
    Title of host publication2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003
    Place of PublicationPiscataway
    PublisherInstitute of Electrical and Electronics Engineers
    Pages55-62
    ISBN (Print)0-8703-7717-6
    Publication statusPublished - 2003

    Cite this

    Bogaard, van den, J. A., Jayaram, J. S. R., & Brombacher, A. C. (2003). A method for reliability optimization through degradation analysis and robust design. In 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003 (pp. 55-62). Piscataway: Institute of Electrical and Electronics Engineers.
    Bogaard, van den, J.A. ; Jayaram, J.S.R. ; Brombacher, A.C. / A method for reliability optimization through degradation analysis and robust design. 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Piscataway : Institute of Electrical and Electronics Engineers, 2003. pp. 55-62
    @inproceedings{4e17e98de3c0417ea7b2e36fbbb3756b,
    title = "A method for reliability optimization through degradation analysis and robust design",
    author = "{Bogaard, van den}, J.A. and J.S.R. Jayaram and A.C. Brombacher",
    year = "2003",
    language = "English",
    isbn = "0-8703-7717-6",
    pages = "55--62",
    booktitle = "2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003",
    publisher = "Institute of Electrical and Electronics Engineers",
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    Bogaard, van den, JA, Jayaram, JSR & Brombacher, AC 2003, A method for reliability optimization through degradation analysis and robust design. in 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Institute of Electrical and Electronics Engineers, Piscataway, pp. 55-62.

    A method for reliability optimization through degradation analysis and robust design. / Bogaard, van den, J.A.; Jayaram, J.S.R.; Brombacher, A.C.

    2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Piscataway : Institute of Electrical and Electronics Engineers, 2003. p. 55-62.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - A method for reliability optimization through degradation analysis and robust design

    AU - Bogaard, van den, J.A.

    AU - Jayaram, J.S.R.

    AU - Brombacher, A.C.

    PY - 2003

    Y1 - 2003

    M3 - Conference contribution

    SN - 0-8703-7717-6

    SP - 55

    EP - 62

    BT - 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003

    PB - Institute of Electrical and Electronics Engineers

    CY - Piscataway

    ER -

    Bogaard, van den JA, Jayaram JSR, Brombacher AC. A method for reliability optimization through degradation analysis and robust design. In 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Piscataway: Institute of Electrical and Electronics Engineers. 2003. p. 55-62