A method for reliability optimization through degradation analysis and robust design

J.A. Bogaard, van den; J.S.R. Jayaram; A.C. Brombacher

A method for reliability optimization through degradation analysis and robust design

J.A. Bogaard, van den, J.S.R. Jayaram, A.C. Brombacher

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	55-62
ISBN (Print)	0-8703-7717-6
Publication status	Published - 2003

Cite this

Bogaard, van den, J. A., Jayaram, J. S. R., & Brombacher, A. C. (2003). A method for reliability optimization through degradation analysis and robust design. In 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003 (pp. 55-62). Institute of Electrical and Electronics Engineers.

Bogaard, van den, J.A. ; Jayaram, J.S.R. ; Brombacher, A.C. / A method for reliability optimization through degradation analysis and robust design. 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Piscataway : Institute of Electrical and Electronics Engineers, 2003. pp. 55-62

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title = "A method for reliability optimization through degradation analysis and robust design",

author = "{Bogaard, van den}, J.A. and J.S.R. Jayaram and A.C. Brombacher",

year = "2003",

language = "English",

isbn = "0-8703-7717-6",

pages = "55--62",

booktitle = "2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003",

publisher = "Institute of Electrical and Electronics Engineers",

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}

Bogaard, van den, JA, Jayaram, JSR & Brombacher, AC 2003, A method for reliability optimization through degradation analysis and robust design. in 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Institute of Electrical and Electronics Engineers, Piscataway, pp. 55-62.

A method for reliability optimization through degradation analysis and robust design. / Bogaard, van den, J.A.; Jayaram, J.S.R.; Brombacher, A.C.
2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Piscataway: Institute of Electrical and Electronics Engineers, 2003. p. 55-62.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A method for reliability optimization through degradation analysis and robust design

AU - Bogaard, van den, J.A.

AU - Jayaram, J.S.R.

AU - Brombacher, A.C.

PY - 2003

Y1 - 2003

M3 - Conference contribution

SN - 0-8703-7717-6

SP - 55

EP - 62

BT - 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

Bogaard, van den JA, Jayaram JSR, Brombacher AC. A method for reliability optimization through degradation analysis and robust design. In 2003 Proceedings annual reliability and maintainability symposium, RAMS, the international symposium on product quality and integrity : Tampa, Florida, USA, 27-30 January 2003. Piscataway: Institute of Electrical and Electronics Engineers. 2003. p. 55-62