A masking technique to perform high accuracy diffraction experiments on FIB-machined specimens

Tijmen Vermeij, Emeric Plancher, C.C. Tasan

Research output: Contribution to conferencePosterAcademic

16 Downloads (Pure)
Original languageEnglish
DOIs
Publication statusPublished - 1 Apr 2017
EventEBSD 2017 - Oxford, United Kingdom
Duration: 4 Apr 20175 Apr 2017

Conference

ConferenceEBSD 2017
CountryUnited Kingdom
CityOxford
Period4/04/175/04/17

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