A masking technique to perform high accuracy diffraction experiments on FIB-machined specimens

Tijmen Vermeij, Emeric Plancher, C.C. Tasan

Research output: Contribution to conference › Poster

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Original language	English
DOIs	https://doi.org/10.13140/RG.2.2.18529.20324
Publication status	Published - 1 Apr 2017
Event	EBSD 2017 - Oxford, United Kingdom Duration: 4 Apr 2017 → 5 Apr 2017

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@conference{6bbbe9f423f04608a94b5785e9cbbf2b,

title = "A masking technique to perform high accuracy diffraction experiments on FIB-machined specimens",

author = "Tijmen Vermeij and Emeric Plancher and C.C. Tasan",

year = "2017",

month = apr,

day = "1",

doi = "10.13140/RG.2.2.18529.20324",

language = "English",

note = "EBSD 2017 ; Conference date: 04-04-2017 Through 05-04-2017",

}