A masking technique to perform high accuracy diffraction experiments on FIB-machined specimens

Tijmen Vermeij, Emeric Plancher, C.C. Tasan

Research output: Contribution to conferencePoster

12 Downloads (Pure)
Original languageEnglish
DOIs
Publication statusPublished - 1 Apr 2017
EventEBSD 2017 - Oxford, United Kingdom
Duration: 4 Apr 20175 Apr 2017

Conference

ConferenceEBSD 2017
CountryUnited Kingdom
CityOxford
Period4/04/175/04/17

Cite this

Vermeij, T., Plancher, E., & Tasan, C. C. (2017). A masking technique to perform high accuracy diffraction experiments on FIB-machined specimens. Poster session presented at EBSD 2017, Oxford, United Kingdom. https://doi.org/10.13140/RG.2.2.18529.20324