A J-function for marked point patterns

M.N.M. Lieshout, van

    Research output: Contribution to journalArticleAcademicpeer-review

    15 Citations (Scopus)


    We propose a new summary statistic for marked point patterns. The underlying principle is to compare the distance from a marked point to the nearest other marked point in the pattern to the same distance seen from an arbitrary point in space. Information about the range of interaction can be inferred, and the statistic is well-behaved under random mark allocation. We develop a range of Hanisch style kernel estimators to tackle the problems of exploding tail variance earlier associated with J-function plug-in estimators, and carry out an exploratory analysis of a forestry data set.
    Original languageEnglish
    Pages (from-to)235-259
    JournalAnnals of the Institute of Statistical Mathematics
    Issue number2
    Publication statusPublished - 2006


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