Abstract
In this work is presented a gravure-printed unipolar Organic Thin-Film Transistor (OTFT) technology able to achieve state-of-the-art yield performance. A multilayer cross-linked dielectric is printed to reduce gate-leakage defects, which have been found to be one of the main failure mechanisms in previous printed OTFTs. The defectivity analysis performed at transistor level reveals 99.8% defect-free devices in a sample of 540 OTFTs, manufactured on 6 successive foils. A novel row driver circuit for matrix-addressing applications has been designed and fabricated using the improved technology. The experimental characterization of the proposed 8-stage row drivers reveals a circuit yield as high as 100%, over 15 samples in 5 successive foils, corresponding to a total number of 2085 fully functional OTFTs. The availability of a printed organic technology compatible with mass production is expected to enable innovative Internet of Things (IoT) applications characterized by extremely low production cost.
Original language | English |
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Article number | 8822469 |
Pages (from-to) | 1682-1685 |
Number of pages | 4 |
Journal | IEEE Electron Device Letters |
Volume | 40 |
Issue number | 10 |
DOIs | |
Publication status | Published - Oct 2019 |
Funding
Manuscript received June 17, 2019; revised August 19, 2019; accepted August 27, 2019. Date of publication September 2, 2019; date of current version September 25, 2019. This work was supported by the European Commission (ATLASS Project, Horizon 2020, Nanotechnologies, and Advanced Material and Production Theme) under Contract 636130. The review of this letter was arranged by Editor D. Shahrjerdi. (Corresponding author: Marco Fattori.) M. Fattori, J. Fijn, P. Harpe, and E. Cantatore are with the Department of Electrical Engineering, Eindhoven University of Technology, 5600MB Eindhoven, The Netherlands (e-mail: [email protected]; [email protected]; [email protected]; [email protected]).
Keywords
- flexible electronics
- organic row drivers
- OTFTs
- Printed electronics
- yield performance