A dynamic range enhancement technique for switched-capacitor pipelined ADC for sampling large crest factor signals

Y. Lin, J.A. Hegt, K. Doris, A.H.M. Roermund, van

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Abstract only.

Original language	English
Title of host publication	Proceedings of 21st ProRISC Workshop of the STW.ICT Conference, 18-19 November 2010, Veldhoven, The Netherlands
Place of Publication	Utrecht
Publisher	STW Technology Foundation
ISBN (Print)	978-90-73461-67-3
Publication status	Published - 2010

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title = "A dynamic range enhancement technique for switched-capacitor pipelined ADC for sampling large crest factor signals",

abstract = "Abstract only.",

author = "Y. Lin and J.A. Hegt and K. Doris and \{Roermund, van\}, A.H.M.",

year = "2010",

language = "English",

isbn = "978-90-73461-67-3",

booktitle = "Proceedings of 21st ProRISC Workshop of the STW.ICT Conference, 18-19 November 2010, Veldhoven, The Netherlands",

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A dynamic range enhancement technique for switched-capacitor pipelined ADC for sampling large crest factor signals. / Lin, Y.; Hegt, J.A.; Doris, K. et al.
Proceedings of 21st ProRISC Workshop of the STW.ICT Conference, 18-19 November 2010, Veldhoven, The Netherlands. Utrecht: STW Technology Foundation, 2010.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A dynamic range enhancement technique for switched-capacitor pipelined ADC for sampling large crest factor signals

AU - Lin, Y.

AU - Hegt, J.A.

AU - Doris, K.

AU - Roermund, van, A.H.M.

PY - 2010

Y1 - 2010

N2 - Abstract only.

AB - Abstract only.

M3 - Conference contribution

SN - 978-90-73461-67-3

BT - Proceedings of 21st ProRISC Workshop of the STW.ICT Conference, 18-19 November 2010, Veldhoven, The Netherlands

PB - STW Technology Foundation

CY - Utrecht

ER -