A dual-polarised probe for near-field antenna measurements

Kees van 't Klooster, Marius Hofmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

A dual-polarised probe is discussed for planar nearfield (NF) antenna measurements with a background. The probe has a low cross-polarisation. Analysis has been revisited recently, results of which are presented. Computational power allows to use Method of Moments (MoM) tools. Bodies of revolution can be handled by a tool like CHAMP. A 3-dimensional MoM analysis has been carried out with the tool CST. Both CHAMP and CST are available at Wroclaw Technical University. Comparisons with old experimental results is shown. The analysis permits to realise an accurate probe model for efficient use in planar NF measurement schemes, including rectangular, polar or bipolar. Modelling shows that a fine meshing is needed in terms of wavelength to represent accurately low cross-polarisation levels.

Translated title of the contributionEen probe voor twee polarisaties voor nabije veld antenne metingen
Original languageEnglish
Title of host publication2016 21st International Conference on Microwave, Radar and Wireless Communications, MIKON 2016
EditorsArtur Rydosz
PublisherInstitute of Electrical and Electronics Engineers
Number of pages4
ISBN (Electronic)9781509022144
DOIs
Publication statusPublished - 14 Jun 2016
Event21st International Conference on Microwave, Radar and Wireless Communications, MIKON 2016 - Krakow, Poland
Duration: 9 May 201611 May 2016

Conference

Conference21st International Conference on Microwave, Radar and Wireless Communications, MIKON 2016
Country/TerritoryPoland
CityKrakow
Period9/05/1611/05/16

Keywords

  • Antenna measurement
  • Cross-polarisation
  • EM analysis
  • Near-field probe

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