A contribution to testing of analog integrated circuits in de DC domain

D.M.W. Leenaerts, J. Spaandonk, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceeding of European Test Conference 1993, Rotterdam, The Netherlands
Pages131-137
Publication statusPublished - 1993
Event1993 European Test Conference - Rotterdam, Netherlands
Duration: 1 Jan 1993 → …

Conference

Conference1993 European Test Conference
CountryNetherlands
CityRotterdam
Period1/01/93 → …

Cite this

Leenaerts, D. M. W., & Spaandonk, van, J. (1993). A contribution to testing of analog integrated circuits in de DC domain. In Proceeding of European Test Conference 1993, Rotterdam, The Netherlands (pp. 131-137)