A contribution to testing of analog integrated circuits in de DC domain

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceeding of European Test Conference 1993, Rotterdam, The Netherlands
Pages	131-137
Publication status	Published - 1993
Event	1993 European Test Conference - Rotterdam, Netherlands Duration: 1 Jan 1993 → …

Cite this

@inproceedings{a944f901cd5649968784b59e524820f6,

title = "A contribution to testing of analog integrated circuits in de DC domain",

author = "D.M.W. Leenaerts and {Spaandonk, van}, J.",

year = "1993",

language = "English",

pages = "131--137",

booktitle = "Proceeding of European Test Conference 1993, Rotterdam, The Netherlands",

note = "1993 European Test Conference ; Conference date: 01-01-1993",

}