Projects per year
Abstract
A general, transparent, finite-strain Integrated Digital Image Correlation (IDIC) framework for high angular resolution EBSD (HR-EBSD) is proposed, and implemented through a rigorous derivation of the optimization scheme starting from the fundamental brightness conservation equation in combination with a clear geometric model of the Electron BackScatter Pattern (EBSP) formation. This results in a direct one-step correlation of the full field-of-view of EBSPs, which is validated here on dynamically simulated patterns. Strain and rotation component errors are, on average, (well) below 10−5 for small (Eeq=0.05%) and medium (Eeq=0.2%) strain, and below 3×10−5 for large strain (Eeq=1%), all for large rotations up to 10° and 2% image noise. High robustness against poor initial guesses (1° misorientation and zero strain) and typical convergence in 5 iterations is consistently observed for, respectively, image noise up to 20% and 5%. This high accuracy and robustness rivals, when comparing validation on dynamically simulated patterns, the most accurate HR-EBSD algorithms currently available which combine sophisticated filtering and remapping strategies with an indirect two-step correlation approach of local subset ROIs. The proposed general IDIC/HR-EBSD framework lays the foundation for future extensions towards more accurate EBSP formation models or even absolute HR-EBSD.
Original language | English |
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Pages (from-to) | 44-50 |
Number of pages | 7 |
Journal | Ultramicroscopy |
Volume | 191 |
DOIs | |
Publication status | Published - 1 Aug 2018 |
Keywords
- Electron backscatter diffraction
- Finite-strain formulation
- High angular resolution EBSD
- High strain accuracy
- HR-EBSD
- Integrated DIC
- Virtual experiments
Fingerprint
Dive into the research topics of 'A consistent full-field integrated DIC framework for HR-EBSD'. Together they form a unique fingerprint.Projects
- 1 Finished
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Unraveling the effect of microstructure statistics on failure of multiphase steels NWO-TTW/HTM 16348
Hoefnagels, J. P. M. (Project Manager), van Maris, M. P. F. H. L. (Project member), Vermeij, T. (Project member) & Wijnen, J. (Project member)
1/01/18 → 31/12/22
Project: Research direct
Prizes
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2nd Prize Michael Sutton International Student Competition, SEM Conference 2019
Vermeij, T. (Recipient), Jun 2019
Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific
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2nd Prize Poster Competition, the annual EBSD meeting of the Royal Microscopy Society 2018
Vermeij, T. (Recipient), Apr 2018
Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific
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Equipment
Research output
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Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction
Vermeij, T., De Graef, M. & Hoefnagels, J. (Corresponding author), 15 Mar 2019, In: Scripta Materialia. 162, p. 266-271 6 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile26 Citations (Scopus)79 Downloads (Pure) -
Can we use electrons to measure local stresses in polycrystalline materials?
Vermeij, T. & Hoefnagels, J. P. M., 13 Dec 2018.Research output: Contribution to conference › Poster
Open AccessFile -
Integrated DIC based HR-EBSD: High accuracy and robustness
Vermeij, T. & Hoefnagels, J. P. M., 1 Apr 2018.Research output: Contribution to conference › Poster
Open AccessFile57 Downloads (Pure)