A computational method for optimizing storage placement to maximize power network reliability

Debarati Bhaumik, Daan Crommelin, Bert Zwart

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Abstract

The intermittent nature of renewable energy sources challenges the power network reliability. However, these challenges can be alleviated by incorporating energy storage devices into the network. We develop a computational technique which can find the optimal storage placement in the network with stochastic power injections, subject to minimizing a reliability index: The probability of a line current violation. We use the simulated annealing algorithm to minimize this probability under the variation of storage locations and capacities in the network, keeping the total storage capacity constant. In order to estimate the small probabilities of line current violations we use the splitting technique of rare-event simulation. We construct an appropriate importance function for splitting which enhances the efficiency of the probability estimator compared to the conventional Crude Monte Carlo estimator. As an illustration, we apply our method to the IEEE-14 bus network.

Original languageEnglish
Title of host publication2016 Winter Simulation Conference
Subtitle of host publicationSimulating Complex Service Systems, WSC 2016
EditorsTheresa M. Roeder, Peter I. Frazier, Robert Szechtman, Enlu Zhou
PublisherInstitute of Electrical and Electronics Engineers
Pages883-894
Number of pages12
ISBN (Electronic)9781509044863
DOIs
Publication statusPublished - 2 Jul 2016
Event2016 Winter Simulation Conference, WSC 2016 - Washington, D.C., Arlington, United States
Duration: 11 Dec 201614 Dec 2016
http://informs-sim.org/wsc16papers/by_area.html

Conference

Conference2016 Winter Simulation Conference, WSC 2016
Abbreviated titleWSC 2016
Country/TerritoryUnited States
CityArlington
Period11/12/1614/12/16
Internet address

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

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