A Breakthrough Industrial THz Application: Robust In-Situ THz-Based Paint Layer Monitoring

D.J.H.C. Maas; A. Frank; J.L.M. van Mechelen

doi:10.1364/CLEO_AT.2019.ATh4K.1

A Breakthrough Industrial THz Application: Robust In-Situ THz-Based Paint Layer Monitoring

D.J.H.C. Maas
, A. Frank
, J.L.M. van Mechelen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

Abstract

We present a THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. The layers can be measured simultaneously with an average error smaller than 1.1 μm.

Original language	English
Title of host publication	2019 Conference on Lasers and Electro-Optics (CLEO)
Publisher	Institute of Electrical and Electronics Engineers
Pages	ATh4K
Number of pages	2
ISBN (Electronic)	978-1-943580-57-6
DOIs	https://doi.org/10.1364/CLEO_AT.2019.ATh4K.1
Publication status	Published - 1 Jul 2019
Externally published	Yes
Event	2019 Conference on Lasers and Electro-Optics, CLEO 2019 - San Jose, United States Duration: 5 May 2019 → 10 May 2019

Conference

Conference	2019 Conference on Lasers and Electro-Optics, CLEO 2019
Country/Territory	United States
City	San Jose
Period	5/05/19 → 10/05/19

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10.1364/CLEO_AT.2019.ATh4K.1

Cite this

@inproceedings{47a25851c5c64bb69b243e0823290b71,

title = "A Breakthrough Industrial THz Application: Robust In-Situ THz-Based Paint Layer Monitoring",

abstract = "We present a THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. The layers can be measured simultaneously with an average error smaller than 1.1 μm.",

author = "D.J.H.C. Maas and A. Frank and \{van Mechelen\}, J.L.M.",

year = "2019",

month = jul,

day = "1",

doi = "10.1364/CLEO\_AT.2019.ATh4K.1",

language = "English",

pages = "ATh4K",

booktitle = "2019 Conference on Lasers and Electro-Optics (CLEO)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2019 Conference on Lasers and Electro-Optics, CLEO 2019 ; Conference date: 05-05-2019 Through 10-05-2019",

}

Maas, DJHC, Frank, A & van Mechelen, JLM 2019, A Breakthrough Industrial THz Application: Robust In-Situ THz-Based Paint Layer Monitoring. in 2019 Conference on Lasers and Electro-Optics (CLEO)., 8750094, Institute of Electrical and Electronics Engineers, pp. ATh4K, 2019 Conference on Lasers and Electro-Optics, CLEO 2019, San Jose, California, United States, 5/05/19. https://doi.org/10.1364/CLEO_AT.2019.ATh4K.1

A Breakthrough Industrial THz Application: Robust In-Situ THz-Based Paint Layer Monitoring. / Maas, D.J.H.C.; Frank, A.; van Mechelen, J.L.M.
2019 Conference on Lasers and Electro-Optics (CLEO). Institute of Electrical and Electronics Engineers, 2019. p. ATh4K 8750094.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A Breakthrough Industrial THz Application

T2 - 2019 Conference on Lasers and Electro-Optics, CLEO 2019

AU - Maas, D.J.H.C.

AU - Frank, A.

AU - van Mechelen, J.L.M.

PY - 2019/7/1

Y1 - 2019/7/1

N2 - We present a THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. The layers can be measured simultaneously with an average error smaller than 1.1 μm.

AB - We present a THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. The layers can be measured simultaneously with an average error smaller than 1.1 μm.

UR - https://www.scopus.com/pages/publications/85068172856

U2 - 10.1364/CLEO_AT.2019.ATh4K.1

DO - 10.1364/CLEO_AT.2019.ATh4K.1

M3 - Conference contribution

SP - ATh4K

BT - 2019 Conference on Lasers and Electro-Optics (CLEO)

PB - Institute of Electrical and Electronics Engineers

Y2 - 5 May 2019 through 10 May 2019

ER -

A Breakthrough Industrial THz Application: Robust In-Situ THz-Based Paint Layer Monitoring

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Conference

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