A binary-to-thermometer decoder with built-in redundancy for improved DAC Yield

G.I. Radulov; P.J. Quinn; P.C.W. Beek, van; J.A. Hegt; A.H.M. Roermund, van

A binary-to-thermometer decoder with built-in redundancy for improved DAC Yield

G.I. Radulov, P.J. Quinn, P.C.W. Beek, van, J.A. Hegt, A.H.M. Roermund, van

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

This paper describes a new architecture for binary-to-thermometer decoders used in segmented D/A converters. To improve basic converter characteristics, the architecture features redundant output thermometer code. The main concept offers two modes of operation. Each mode generates a different thermometer output, i.e. a different switching sequence for the DAC MSB thermometer analog elements. This results in two different transfer characteristics of the whole DAC for the same mismatch errors of its elements. After on-chip or off-chip measurements, the more linear transfer characteristic can be selected. In this way, chip yield is improved and the design requirements can be relaxed. Ultimately, the advantages introduced by the proposed decoder will lead to cheaper and smaller D/A Converters.

Original language	English
Title of host publication	Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2006) 21 - 24 May 2006, Island of Kos, Greece
Place of Publication	Piscataway, New Jersey, USA
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Print)	0-7803-9389-9
Publication status	Published - 2006
Event	2006 IEEE International Symposium on Circuits and Systems (ISCAS 2006) - Kos International Convention Centre (KICC), Island of Kos, Greece Duration: 21 May 2006 → 24 May 2006

Conference

Conference	2006 IEEE International Symposium on Circuits and Systems (ISCAS 2006)
Abbreviated title	ISCAS 2006
Country/Territory	Greece
City	Island of Kos
Period	21/05/06 → 24/05/06

Cite this

@inproceedings{905c747e1c134a8298e38d7e54f997bc,

title = "A binary-to-thermometer decoder with built-in redundancy for improved DAC Yield",

abstract = "This paper describes a new architecture for binary-to-thermometer decoders used in segmented D/A converters. To improve basic converter characteristics, the architecture features redundant output thermometer code. The main concept offers two modes of operation. Each mode generates a different thermometer output, i.e. a different switching sequence for the DAC MSB thermometer analog elements. This results in two different transfer characteristics of the whole DAC for the same mismatch errors of its elements. After on-chip or off-chip measurements, the more linear transfer characteristic can be selected. In this way, chip yield is improved and the design requirements can be relaxed. Ultimately, the advantages introduced by the proposed decoder will lead to cheaper and smaller D/A Converters.",

author = "G.I. Radulov and P.J. Quinn and {Beek, van}, P.C.W. and J.A. Hegt and {Roermund, van}, A.H.M.",

year = "2006",

language = "English",

isbn = "0-7803-9389-9",

booktitle = "Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2006) 21 - 24 May 2006, Island of Kos, Greece",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2006 IEEE International Symposium on Circuits and Systems (ISCAS 2006), ISCAS 2006 ; Conference date: 21-05-2006 Through 24-05-2006",

}

Radulov, GI, Quinn, PJ, Beek, van, PCW, Hegt, JA & Roermund, van, AHM 2006, A binary-to-thermometer decoder with built-in redundancy for improved DAC Yield. in Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2006) 21 - 24 May 2006, Island of Kos, Greece. Institute of Electrical and Electronics Engineers, Piscataway, New Jersey, USA, 2006 IEEE International Symposium on Circuits and Systems (ISCAS 2006), Island of Kos, Greece, 21/05/06.

A binary-to-thermometer decoder with built-in redundancy for improved DAC Yield. / Radulov, G.I.; Quinn, P.J.; Beek, van, P.C.W. et al.
Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2006) 21 - 24 May 2006, Island of Kos, Greece. Piscataway, New Jersey, USA: Institute of Electrical and Electronics Engineers, 2006.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A binary-to-thermometer decoder with built-in redundancy for improved DAC Yield

AU - Radulov, G.I.

AU - Quinn, P.J.

AU - Beek, van, P.C.W.

AU - Hegt, J.A.

AU - Roermund, van, A.H.M.

PY - 2006

Y1 - 2006

N2 - This paper describes a new architecture for binary-to-thermometer decoders used in segmented D/A converters. To improve basic converter characteristics, the architecture features redundant output thermometer code. The main concept offers two modes of operation. Each mode generates a different thermometer output, i.e. a different switching sequence for the DAC MSB thermometer analog elements. This results in two different transfer characteristics of the whole DAC for the same mismatch errors of its elements. After on-chip or off-chip measurements, the more linear transfer characteristic can be selected. In this way, chip yield is improved and the design requirements can be relaxed. Ultimately, the advantages introduced by the proposed decoder will lead to cheaper and smaller D/A Converters.

AB - This paper describes a new architecture for binary-to-thermometer decoders used in segmented D/A converters. To improve basic converter characteristics, the architecture features redundant output thermometer code. The main concept offers two modes of operation. Each mode generates a different thermometer output, i.e. a different switching sequence for the DAC MSB thermometer analog elements. This results in two different transfer characteristics of the whole DAC for the same mismatch errors of its elements. After on-chip or off-chip measurements, the more linear transfer characteristic can be selected. In this way, chip yield is improved and the design requirements can be relaxed. Ultimately, the advantages introduced by the proposed decoder will lead to cheaper and smaller D/A Converters.

M3 - Conference contribution

SN - 0-7803-9389-9

BT - Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2006) 21 - 24 May 2006, Island of Kos, Greece

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway, New Jersey, USA

T2 - 2006 IEEE International Symposium on Circuits and Systems (ISCAS 2006)

Y2 - 21 May 2006 through 24 May 2006

ER -

A binary-to-thermometer decoder with built-in redundancy for improved DAC Yield

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