A behavioral approach to optimal model reduction

B. Roorda, S. Weiland

Research output: Book/ReportReportPopular

LanguageEnglish
Place of PublicationEindhoven
PublisherEindhoven University of Technology
Number of pages6
StatePublished - 1998

Publication series

NameMeasurement and control systems : internal report
Volume98I/05

Bibliographical note

Paper submitted to the American Control Conference, 1999.

Cite this

Roorda, B., & Weiland, S. (1998). A behavioral approach to optimal model reduction. (Measurement and control systems : internal report; Vol. 98I/05). Eindhoven: Eindhoven University of Technology.
Roorda, B. ; Weiland, S./ A behavioral approach to optimal model reduction. Eindhoven : Eindhoven University of Technology, 1998. 6 p. (Measurement and control systems : internal report).
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title = "A behavioral approach to optimal model reduction",
author = "B. Roorda and S. Weiland",
note = "Paper submitted to the American Control Conference, 1999.",
year = "1998",
language = "English",
series = "Measurement and control systems : internal report",
publisher = "Eindhoven University of Technology",

}

Roorda, B & Weiland, S 1998, A behavioral approach to optimal model reduction. Measurement and control systems : internal report, vol. 98I/05, Eindhoven University of Technology, Eindhoven.

A behavioral approach to optimal model reduction. / Roorda, B.; Weiland, S.

Eindhoven : Eindhoven University of Technology, 1998. 6 p. (Measurement and control systems : internal report; Vol. 98I/05).

Research output: Book/ReportReportPopular

TY - BOOK

T1 - A behavioral approach to optimal model reduction

AU - Roorda,B.

AU - Weiland,S.

N1 - Paper submitted to the American Control Conference, 1999.

PY - 1998

Y1 - 1998

M3 - Report

T3 - Measurement and control systems : internal report

BT - A behavioral approach to optimal model reduction

PB - Eindhoven University of Technology

CY - Eindhoven

ER -

Roorda B, Weiland S. A behavioral approach to optimal model reduction. Eindhoven: Eindhoven University of Technology, 1998. 6 p. (Measurement and control systems : internal report).