Abstract
Nowadays, logic synthesis tools are widely used to optimize and implement digital systems. Verifying the correctness of
the generated circuits is an important practical problem. We present a new formal verification method for large synthesized
circuits. It combines the use of binary decision diagrams (BDDs) with techniques to exploit the structural similarities of the
circuits under comparison. These similarities are detected automatically. We show that the proposed method significantly
extends the capability of BDD-based methods to verify large synthesized circuits.
Original language | English |
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Pages (from-to) | 131-149 |
Number of pages | 19 |
Journal | Integration : the VLSI Journal |
Volume | 23 |
Issue number | 2 |
DOIs | |
Publication status | Published - 1997 |