Abstract
This paper presents an event-driven Discrete-Time Level Crossing Analog-to-Digital Converter (DT-LCADC) that is energy-efficient in the conversion of both sparse and generic signals, and exploits signal sparsity to reduce the output data rate. The proposed DT-LCADC uses the comparator delay, to classify each level-crossing event as slow or fast, according to the rate of change of the input signal. The converter can adaptively select the most suitable search scheme, between linear and binary, according to the type of event. The proposed DTLCADC, manufactured with 65 nm CMOS technology, achieves 9.98 ENOB and a signal bandwidth of 8 kHz, while consuming between 100 and 260 nW from a 0.8 V supply, depending on the input signal. The corresponding Walden FoMW ranges from 6.2 to 16.1 fJ/c.s, achieving a more than 4 X improvement in worstcase power efficiency compared to state-of-the-art DT-LCADCs. To convert time-sparse neural signals, the proposed ADC requires only 110 nW, while reducing the output data rate down to 8.9 kb/s. This leads to a compression ratio of 94.4%, compared to a Nyquist ADC with the same accuracy.
| Original language | English |
|---|---|
| Title of host publication | 2025 IEEE European Solid-State Electronics Research Conference, ESSERC 2025 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 557-560 |
| Number of pages | 4 |
| ISBN (Electronic) | 979-8-3315-2539-2 |
| DOIs | |
| Publication status | Published - 5 Nov 2025 |
| Event | 51st IEEE European Solid-State Electronics Research Conference, ESSERC 2025 - Munich, Germany Duration: 8 Sept 2025 → 11 Sept 2025 |
Conference
| Conference | 51st IEEE European Solid-State Electronics Research Conference, ESSERC 2025 |
|---|---|
| Country/Territory | Germany |
| City | Munich |
| Period | 8/09/25 → 11/09/25 |
Bibliographical note
Publisher Copyright:© 2025 IEEE.
Keywords
- Data Compression
- Edge Computing
- Event-Based Sensor Interface
- Level-Crossing ADC
- Time-sparse signal
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