A 77.3-dB SNDR 62.5-kHz Bandwidth Continuous-Time Noise-Shaping SAR ADC With Duty-Cycled Gm-C Integrator

Hanyue Li (Corresponding author), Yuting Shen, Eugenio Cantatore, Pieter Harpe

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)
392 Downloads (Pure)

Abstract

This article presents a first-order continuous-time (CT) noise-shaping successive-approximation-register (NS-SAR) analog-to-digital converter (ADC). Different from other NS-SAR ADCs in literature, which are discrete-time (DT), this ADC utilizes a CT Gm-C integrator to realize an inherent anti-aliasing function. To cope with the timing conflict between the DT SAR ADC and the CT integrator, the sampling switch of the SAR ADC is removed, and the integrator is duty cycled to leave 5% of the sampling clock period for the SAR conversion. Redundancy is added to track the varying ADC input due to the absence of the sampling switch. A theoretical analysis shows that the 5% duty-cycling has negligible effects on the signal transfer function (STF) and the noise transfer function. The output swing and linearity requirements for the integrator are also relaxed thanks to the inherent feedforward path in the NS-SAR ADC architecture. Fabricated in 65-nm CMOS, the prototype achieves 77.3-dB peak signal-to-noise and distortion ratio (SNDR) in a 62.5-kHz bandwidth while consuming 13.5μ W, leading to a Schreier figure of merit (FoM) of 174.0 dB. Moreover, it provides 15-dB attenuation in the alias band.

Original languageEnglish
Article number9989513
Pages (from-to)939-948
Number of pages10
JournalIEEE Journal of Solid-State Circuits
Volume58
Issue number4
DOIs
Publication statusPublished - 1 Apr 2023

Keywords

  • Anti-aliasing
  • continuous time (CT)
  • current steering
  • duty-cycled integrator
  • noise-shaping successive-approximation-register (NS-SAR) analog-to-digital converter (ADC)

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