A 65-nm-CMOS 100-MHz 87%-efficient DC-DC down converter based on dual-die system-in-package integration

H.J. Bergveld, K. Nowak, R. Karadi, S. Iochem, J. Ferreira, S. Ledain, E. Pieraerts, M. Pommier

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

50 Citations (Scopus)
510 Downloads (Pure)

Abstract

The increasing number of efficient voltage conversions realized in small volumes in many applications has introduced a trend towards small-form-factor DC-DC converters with integrated passives. Preferably, the DC-DC converter is integrated with the load, often in nm-CMOS, allowing for local supply optimization yielding increased power efficiency. However, energy-storage densities in nm-CMOS are low and silicon area is expensive. Therefore, to limit cost of monolithically integrated systems, passive components have low values, leading to very high switching frequencies, which compromises efficiency. This paper follows an alternative approach, where the active converter part is realized in 65-nm CMOS and the passive part in a low-cost high-density passive-integration process. With the active die flip-chipped on the passive die a small system-in-package (SiP) is obtained with a peak efficiency of 87.5% at 100 MHz switching frequency and 85 mW output power. This performance is mainly caused by the high quality of the integrated passives.
Original languageEnglish
Title of host publicationProc. IEEE Energy Conversion Congress and Exposition (ECCE'09), San Jose, USA, 20-24 Sept. 2009
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages3698-3705
DOIs
Publication statusPublished - 2009

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