A 158-mW 360-MHz BW 68-dB DR Continuous-Time 1-1-1 Filtering MASH ADC in 40-nm CMOS

Qilong Liu (Corresponding author), Lucien J. Breems, Shagun Bajoria, Muhammed Bolatkale, Robert Rutten, Georgi Radulov

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)
154 Downloads (Pure)

Abstract

This article presents a 5-GS/s continuous-time (CT) multi-stage noise-shaping (MASH) analog-to-digital converter (ADC). The ADC consists of three first-order modulators with a 3-bit quantizer/digital-to-analog converter (DAC) per stage. An RC-hybrid stabilization DAC is used to compensate for the excess loop delay and excess phase shift. A delay matching all-pass input filter with a low-pass feedforward filter is employed to suppress input signal leakage. As a result, inter-stage DACs are waived in residue generation, and low-power, area-saving Gm-C integrators are enabled in the back-end stages. The MASH ADC was implemented in 40-nm CMOS and occupies 0.21 mm2. The ADC achieves 68-dB dynamic range (DR) and 65-dB signal-to-noise and distortion ratio (SNDR) over a 360-MHz bandwidth (BW). The ADC consumes 158 mW from 1/1.1/1.8 V supplies, yielding 159-dB Schreier figure-of-merit (FOM) and 151-fJ/Conv. Walden FOM.

Original languageEnglish
Pages (from-to)3781-3793
Number of pages13
JournalIEEE Journal of Solid-State Circuits
Volume57
Issue number12
DOIs
Publication statusPublished - 1 Dec 2022

Keywords

  • All-pass filter (APF)
  • analog-to-digital conversion
  • continuous-time (CT) analog-to-digital converter (ADC)
  • delta-sigma modulator
  • excess loop delay (ELD)
  • inter-stage connection
  • multi-stage noise-shaping (MASH)
  • oversampling ADC
  • oversampling ratio (OSR)
  • residue generation

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