A 10b/12b 40kS/s SAR ADC with Data-Driven Noise Reduction achieving up to 10.1b ENOB at 2.2fJ/conversion-step

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Abstract

This paper presents a power-efficient 10/12 bit 40 kS/s SAR ADC for sensor applications. It supports resolutions of 10 and 12 bit and sample rates from DC up to 40 kS/s to accommodate a variety of sensor applications. A Data-Driven Noise-Reduction method is introduced to selectively enhance the comparator noise performance. In this way, a higher ADC resolution can be achieved with a small increase of the power consumption. A self-oscillating comparator is used to generate the bit-cycling clock internally. In this way, the ADC only requires an external clock at the sample-rate frequency. A segmented capacitive DAC with 250 aF unit elements is applied to save power and to reduce DNL errors at the same time. The implemented prototype in 65 nm CMOS occupies an area of 0.076 mm$^2$. For the two supported resolutions (10/12 bit), the ADC achieves an ENOB of 9.4 and 10.1 bit while consuming 72 and 97 nW from a 0.6 V supply at 40 kS/s. This leads to power efficiencies of 2.7 and 2.2 fJ/conversion-step for 10 bit and 12 bit resolution, respectively. Furthermore, the leakage power, which is below 0.4 nW, ensures that the efficiency can be maintained down to very low sample rates.
Original languageEnglish
Pages (from-to)3011-3018
Number of pages8
JournalIEEE Journal of Solid-State Circuits
Volume48
Issue number12
DOIs
Publication statusPublished - 2013

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