3D-morphology reconstruction of nanoscale phase-separation in polymer memory blends

S. Khikhlovskyi, A.J.J.M. Breemen, van, J.J. Michels, R.A.J. Janssen, G. Gelinck, M. Kemerink

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Abstract

In many organic electronic devices functionality is achieved by blending two or more materials, typically polymers or molecules, with distinctly different optical or electrical properties in a single film. The local scale morphology of such blends is vital for the device performance. Here, a simple approach to study the full 3D morphology of phase-separated blends, taking advantage of the possibility to selectively dissolve the different components is introduced. This method is applied in combination with AFM to investigate a blend of a semiconducting and ferroelectric polymer typically used as active layer in organic ferroelectric resistive switches. It is found that the blend consists of a ferroelectric matrix with three types of embedded semiconductor domains and a thin wetting layer at the bottom electrode. Statistical analysis of the obtained images excludes the presence of a fourth type of domains. The criteria for the applicability of the presented technique are discussed.
Original languageEnglish
Pages (from-to)1231-1237
Number of pages7
JournalJournal of Polymer Science, Part B: Polymer Physics
Volume53
Issue number17
DOIs
Publication statusPublished - 1 Sep 2015

Keywords

  • AFM
  • phase separation
  • organic memory
  • selective dissolution
  • thin films

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