20GHz to 480GHz on-chip broadband spectrometer in 65-nm CMOS technology

M.K. Matters-Kammerer, D. van Goor, L. Tripodi

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

The implementation and characterization of a 20 GHz to 480 GHz continuously tunable on-chip spectrometer in 65-nm CMOS technology is presented. The structure consists of a pulse generator based on a meandered nonlinear transmission line, a passive pulse differentiator and a high-speed sample and hold-circuit. Time domain and frequency domain measurements have been performed to characterize the spectrometer. A 3.1 ps fall time of the sampler is derived under optimized bias conditions. The spectrometer generates and detects a tunable frequency comb with frequency components between 20 GHz and 480 GHz, with a signal to noise ratio of 90 dB at 100 GHz, 70 dB at 200 GHz and 40 dB at 480 GHz. Due to the on-chip implementation of the transmitter and sampler, no external lenses are required and the circuit is integrated in an area of 3 mm2. It can be used for on-chip analysis of e.g. droplets in a microfluidic package.

Original languageEnglish
Title of host publicationProceedings of the 46th European Microwave Week
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages349-352
Number of pages4
ISBN (Electronic)9782874870439
DOIs
Publication statusPublished - 2016
Event46th European Microwave Conference (EuMC 2016) - London, United Kingdom
Duration: 4 Oct 20166 Oct 2016
Conference number: 46

Conference

Conference46th European Microwave Conference (EuMC 2016)
Abbreviated titleEuMC 2016
CountryUnited Kingdom
CityLondon
Period4/10/166/10/16

Keywords

  • CMOS
  • Nonlinear transmission line
  • Sensing
  • Terahertz spectroscopy

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    Matters-Kammerer, M. K., van Goor, D., & Tripodi, L. (2016). 20GHz to 480GHz on-chip broadband spectrometer in 65-nm CMOS technology. In Proceedings of the 46th European Microwave Week (pp. 349-352). [7824350] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EuMC.2016.7824350