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1/f noise of point contacts affected by uniform films
L.K.J. Vandamme
Electrical Engineering
Research output
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Contribution to journal
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Article
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peer-review
37
Citations (Scopus)
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Chemistry
Noise
100%
R
75%
Contact Resistance
50%
Semiconductor
25%
Liquid Film
25%
Volume
25%
Engineering
Semiconductor Material
25%
Experimental Investigation
25%
Contact Point
25%
Simple Model
25%
Force (F)
25%
Material Science
Bar (Metal)
50%
Semiconductor Material
25%
Film
25%
Physics
Semiconductor
25%
Calculation
25%
Volume
25%
Noise Intensity
25%