1/f Noise in organic thin film transistors: dependence on geometry, bias and illumination

R. Feyaerts, L.K.J. Vandamme, G. Trefan, C. Detcheverry

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationICNF 2001 - 16th International Conference on Noise in Physical Systems and 1/f Fluctuations
EditorsG. Bosman
Place of PublicationGainesville Florida USA
PublisherWorld Scientific
ISBN (Print)981-02-4677-3
Publication statusPublished - 2001

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