1/f Noise in bipolar transistors: Influence of emitter geometry, edge effects, and current crowding

H.A.W. Markus, B.J.J. Hanssen

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 13th International Conference on Noise in Physical Systems
Place of PublicationSingapore
PublisherWorld Scientific
Pages462-465
Publication statusPublished - 1995
Event13th International Conference on Noise in Physical Systems -
Duration: 1 Jan 1995 → …

Conference

Conference13th International Conference on Noise in Physical Systems
Period1/01/95 → …

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