Abstract
Original language | English |
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Article number | 9130793 |
Pages (from-to) | 1217-1220 |
Number of pages | 4 |
Journal | IEEE Electron Device Letters |
Volume | 41 |
Issue number | 8 |
DOIs | |
Publication status | Published - 1 Aug 2020 |
Funding
Manuscript received May 29, 2020; revised June 25, 2020; accepted June 28, 2020. Date of publication July 1, 2020; date of current version July 24, 2020. This work was supported in part by the European Regional Development Fund through the Flexlines Project through the Interreg V-Program Flanders-The Netherlands, a Cross-Border Cooperation Program, in part by the Province of Noord-Brabant, The Netherlands, and in part by the King Abdullah University of Science and Technology (KAUST) Office for Sponsored Research (OSR) under Award OSR-CRG2018-3783. The review of this letter was arranged by Editor S. Zhang. (Corresponding author: Tamer Dogan.) Tamer Dogan and Gerwin H. Gelinck are with the TNO/Holst Centre, 5656 Eindhoven, The Netherlands, and also with the Department of Applied Physics, Eindhoven University of Technology, 5600 Eindhoven, The Netherlands (e-mail: [email protected]).
Keywords
- High-resolution thin film transistor array
- amorphous Indium Gallium Zinc Oxide thin film transistor
- multi-level nanoimprint lithography