SEMI/TestVision 2020: Best ATE Paper of 2016

  • De Coster, Jeroen (Recipient), De Heyn, Peter (Recipient), Pantouvaki, Marianna (Recipient), Snyder, Brad (Recipient), Chen, Hongtao (Recipient), Marinissen, Erik Jan (Recipient), Absil, Philippe (Recipient), Van Campenhout, Joris (Recipient) & Bolt, Bryan (Recipient)

Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific

Description

Best Paper on Automated Test Equipment (ATE), presented at one of nine selected conferences worldwide on semiconductor testing in 2016.
Awarded date16 Jul 2017
Degree of recognitionInternational
Granting OrganisationsSEMI

Awarded at event

Event titleSEMICON West
LocationSEMICON, San Francisco, CA, United StatesShow on map
Period9 May 2017 → 9 Dec 2017

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