Most Significant Paper Award IEEE International Test Conference (ITC'10)

Marinissen, Erik Jan (Recipient), Goel, Sandeep Kumar (Recipient) & Lousberg, G.E.A. (Recipient)

Electronic Systems

Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific

Description

for
Erik Jan Marinissen, Sandeep Kumar Goel, and Maurice Lousberg, 'Wrapper Design for Embedded Core Test', IEEE International Test Conference (ITC'00), Atlantic City, NJ, October 2000, pp. 911-920

Awarded date	5 Nov 2010
Degree of recognition	International

Awarded at event

Event title	2010 IEEE International Test Conference (ITC 2010)
Location	Marriott Austin Downtown/Convention Cente, Austin, United StatesShow on map
Period	1 Nov 2010 → 5 Nov 2010

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Documents & Links

itc00-wrapper
File: application/pdf, 134 KB
Type: Other
IMG_7811-Edit
File: image/jpeg, 2.9 MB
Type: Other