Event title | 2008 IEEE International Test Conference (ITC 2008) |
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Location | Santa Clara, CA, United States |
Period | 20 Oct 2008 → 24 Oct 2008 |
Most Significant Paper Award IEEE International Test Conference (ITC'08)
- Marinissen, Erik Jan (Recipient), Arendsen, R. (Recipient), Bos, G. A. A. (Recipient), Dingemanse, H. (Recipient), Lousberg, G. E. A. (Recipient) & Wouters, C. R. (Recipient)
Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific