Most Significant Paper Award IEEE International Test Conference (ITC'10)

Prize: OtherCareer, activity or publication related prizes (lifetime, best paper, poster etc.)Scientific

Description

for
Erik Jan Marinissen, Sandeep Kumar Goel, and Maurice Lousberg, 'Wrapper Design for Embedded Core Test', IEEE International Test Conference (ITC'00), Atlantic City, NJ, October 2000, pp. 911-920
Degree of recognitionInternational
OrganisationsIEEE International Test Conference (ITC 2010)

Career, activity or publication related prizes (lifetime, best paper, poster etc.)

event2010 IEEE International Test Conference (ITC 2010)
locationMarriott Austin Downtown/Convention Cente, Austin, United States
Period1 Nov 2010 → 5 Nov 2010