Most Significant Paper Award IEEE International Test Conference (ITC'10)

Erik Jan Marinissen (Recipient), Sandeep Kumar Goel (Recipient) & G.E.A. Lousberg (Recipient)

Electronic Systems

Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific

Description

for
Erik Jan Marinissen, Sandeep Kumar Goel, and Maurice Lousberg, 'Wrapper Design for Embedded Core Test', IEEE International Test Conference (ITC'00), Atlantic City, NJ, October 2000, pp. 911-920

Awarded date	5 Nov 2010
Degree of recognition	International
Organisations	IEEE International Test Conference (ITC 2010)

Career, activity or publication related prizes (lifetime, best paper, poster etc.)

event	2010 IEEE International Test Conference (ITC 2010)
location	Marriott Austin Downtown/Convention Cente, Austin, United States
Period	1 Nov 2010 → 5 Nov 2010

Documents & Links

itc00-wrapper
File: application/pdf, 134 KB
Type: Other
IMG_7811-Edit
File: image/jpeg, 2.9 MB
Type: Other