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Fourier Microscopy for Quality Inspection and Metrology of Nanostructures, NWO-Take off phase 2.
Gómez Rivas, Jaime
(Recipient)
Photonics and Semiconductor Nanophysics
Surface Photonics
Prize
:
NWO
›
Take-off
›
Scientific
Description
Fourier Microscopy for Quality Inspection and Metrology of Nanostructures, NWO-Take off phase 2.
Awarded date
2022
Degree of recognition
National
Granting Organisations
Nederlandse Organisatie voor Wetenschappelijk Onderzoek
Fingerprint
Nanomaterial
100%
Takeoff
100%