Fourier Microscopy for Quality Inspection and Metrology of Nanostructures, NWO-Take off phase 2.

Prize: NWOTake-offScientific

Description

Fourier Microscopy for Quality Inspection and Metrology of Nanostructures, NWO-Take off phase 2.
Degree of recognitionNational
Granting OrganisationsNWO

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