Research output per year
Research output per year
Personal profile
External positions
Cadence Design Systems
IMEC
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Dive into the research topics where Zhan Gao is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality
Gao, Z., Hu, M. C., Malagi, S., Swenton, J., Huisken, J., Goossens, K. & Marinissen, E. J., 26 May 2021, In: Journal of Electronic Testing: Theory and Applications (JETTA). 37, 2, p. 161-189 29 p., https://doi.org/10.1007/s10836-021-05943-3.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile1 Downloads (Pure) -
Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis
Lorenzelli, F., Gao, Z., Swenton, J., Malagi, S. & Marinissen, E. J., 29 Jun 2021, 2021 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers, 6 p. 9465469Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults
Hu, M. C., Gao, Z., Malagi, S., Swenton, J., Huisken, J., Goossens, K., Wu, C. W. & Marinissen, E. J., 26 May 2020, Proceedings 2020 IEEE European Test Symposium, ETS 2020. Piscataway: Institute of Electrical and Electronics Engineers, 6 p. 9131567Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
2 Citations (Scopus) -
Application of cell-aware test on an advanced 3nm CMOS technology library
Gao, Z., Malagi, S., Hu, M. C., Swenton, J., Baert, R., Huisken, J., Chehab, B., Goossens, K. & Marinissen, E. J., Nov 2019, 2019 IEEE International Test Conference, ITC 2019. Piscataway: Institute of Electrical and Electronics Engineers, 6 p. 9000164Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
4 Citations (Scopus) -
Defect-location identification for cell-aware test
Gao, Z., Malagi, S., Marinissen, E. J., Swenton, J., Huisken, J. & Goossens, K., 6 May 2019, LATS 2019 - 20th IEEE Latin American Test Symposium. Piscataway: Institute of Electrical and Electronics Engineers, 6 p. 8704561Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open Access8 Citations (Scopus)
Prizes
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Best Paper Award IEEE Latin-American Test Symposium 2019
Gao, Zhan (Recipient), Malagi, S. (Recipient), Marinissen, Erik Jan (Recipient), Swenton, J. (Recipient), Huisken, Jos A. (Recipient) & Goossens, Kees G.W. (Recipient), 13 Mar 2019
Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific
Courses
Press / Media
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Cell-Aware Test: Research Cooperation Between Cadence, imec, and TU Eindhoven...Now Shipping in Modus DFT Software Solution
Erik Jan Marinissen & Zhan Gao
14/06/19
1 Media contribution
Press/Media: Expert Comment
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imec, TU Eindhoven, and Cadence - Advances in Defect Location Identification
Zhan Gao & Erik Jan Marinissen
30/05/19
1 Media contribution
Press/Media: Expert Comment
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imec, TU Eindhoven, and Cadence – Advances in Defect Location Identification
Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken & Kees Goossens
7/05/19
1 Media contribution
Press/Media: Expert Comment
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Best Paper Award at LATS2019 for Zhan Gao
Zhan Gao & Erik Jan Marinissen
3/04/19
1 item of Media coverage
Press/Media: Research