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Vincent Vandalon

Postdoc, Department of Applied Physics, Plasma & Materials Processing

https://orcid.org/0000-0002-2109-9818

Emailv.vandalon@tue.nl

Source: Scopus

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Second-Harmonic Generation: spectroscopic phase and intensity study of the Si(100) interface with SiO2 and Al2O3 thin films
Author: Vandalon, V., 31 Aug 2011
Supervisor: Terlinden, N. (Supervisor 1) & Kessels, W. (Supervisor 2)
Student thesis: Master

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