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Research Output 2017 2019

  • 19 Citations
  • 5 Article
  • 3 Poster
2019
5 Citations (Scopus)
5 Downloads (Pure)

Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction

Vermeij, T., De Graef, M. & Hoefnagels, J., 15 Mar 2019, In : Scripta Materialia. 162, p. 266-271 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Electron diffraction
diffraction patterns
electron counters
Crystal orientation
Diffraction patterns
6 Downloads (Pure)
Open Access
File
Soldering alloys
Testing
Scanning electron microscopy
Profilometry
Physical vapor deposition
2018
7 Citations (Scopus)
3 Downloads (Pure)

A consistent full-field integrated DIC framework for HR-EBSD

Vermeij, T. & Hoefnagels, J. P. M., 1 Aug 2018, In : Ultramicroscopy. 191, p. 44-50 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Dacarbazine
angular resolution
high resolution
Electrons
conservation equations
16 Downloads (Pure)

Can we use electrons to measure local stresses in polycrystalline materials?

Vermeij, T. & Hoefnagels, J. P. M., 13 Dec 2018.

Research output: Contribution to conferencePosterAcademic

Open Access
File
90 Downloads (Pure)

From fibrils to toughness: Multi-scale mechanics of fibrillating interfaces in stretchable electronics

van der Sluis, O., Vermeij, T., Neggers, J., Vossen, B., van Maris, M., Vanfleteren, J., Geers, M. G. D. & Hoefnagels, J. P. M., 2 Feb 2018, In : Materials. 11, 2, 19 p., 231.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Elastomers
Toughness
Mechanics
Electronic equipment
Metals
13 Downloads (Pure)

Integrated DIC based HR-EBSD: High accuracy and robustness

Vermeij, T. & Hoefnagels, J. P. M., 1 Apr 2018.

Research output: Contribution to conferencePosterAcademic

Open Access
File
7 Citations (Scopus)

Preventing damage and redeposition during focused ion beam milling: the “umbrella” method

Vermeij, T., Plancher, E. & Tasan, C. C., 1 Mar 2018, In : Ultramicroscopy. 186, p. 35-41 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Focused ion beams
ion beams
damage
Electron diffraction
angular resolution
2017
10 Downloads (Pure)

A masking technique to perform high accuracy diffraction experiments on FIB-machined specimens

Vermeij, T., Plancher, E. & Tasan, C. C., 1 Apr 2017.

Research output: Contribution to conferencePosterAcademic

Open Access
File