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Research Output 2017 2019

  • 14 Citations
  • 5 Article
  • 3 Poster
2 Citations (Scopus)

Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction

Vermeij, T., De Graef, M. & Hoefnagels, J., 15 Mar 2019, In : Scripta Materialia. 162, p. 266-271 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Electron diffraction
diffraction patterns
electron counters
Crystal orientation
Diffraction patterns
Open Access
File
Microscopic examination
Mechanical testing
Testing
Scanning electron microscopy
Profilometry
5 Citations (Scopus)

A consistent full-field integrated DIC framework for HR-EBSD

Vermeij, T. & Hoefnagels, J. P. M., 1 Aug 2018, In : Ultramicroscopy. 191, p. 44-50 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Dacarbazine
angular resolution
high resolution
Electrons
conservation equations

Can we use electrons to measure local stresses in polycrystalline materials?

Vermeij, T. & Hoefnagels, J. P. M., 13 Dec 2018

Research output: Contribution to conferencePosterAcademic

Open Access
File

From fibrils to toughness: Multi-scale mechanics of fibrillating interfaces in stretchable electronics

van der Sluis, O., Vermeij, T., Neggers, J., Vossen, B., van Maris, M., Vanfleteren, J., Geers, M. G. D. & Hoefnagels, J. P. M., 2 Feb 2018, In : Materials. 11, 2, p. 231 19 p., 231

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Elastomers
Toughness
Mechanics
Electronic equipment
Metals