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Personal profile


Materials are important, but do we understand them?

Research profile

Tijmen Vermeij is a PhD Candidate in the Mechanics of Materials group at Mechanical Engineering. His PhD project, supervised by Johan Hoefnagels, focuses on experimental investigations of micromechanical deformation and damage mechanisms in Dual-Phase Steels. This research is primarily conducted by combining advanced microscopic techniques on micromechanical deformation tests, through which the full chain of deformation and damage events can be tracked. Other research interests involve the development of state-of-the-art Electron Backscatter Diffraction (EBSD) and Digital Image Correlation (DIC) methods.

Academic background

Tijmen Vermeij obtained his BSc and MSc degree (Cum Laude) in Mechanical Engineering at TU/e. For his MSc internship, he visited the research group of Prof. Cem Tasan at the Massachusetts Institute of Technology (MIT), Boston, USA for a period of four months. For his MSc final project, he worked on the development of state-of-the-art 3D residuals stress measurements, which resulted in two journal publications and the prize for the best MSc thesis in the year 2018 at the Eindhoven University of Technology.

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angular resolution Physics & Astronomy
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Research Output 2017 2019

  • 22 Citations
  • 5 Article
  • 3 Poster
8 Citations (Scopus)
3 Downloads (Pure)

A consistent full-field integrated DIC framework for HR-EBSD

Vermeij, T. & Hoefnagels, J. P. M., 1 Aug 2018, In : Ultramicroscopy. 191, p. 44-50 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

angular resolution
high resolution
conservation equations
6 Citations (Scopus)
5 Downloads (Pure)

Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction

Vermeij, T., De Graef, M. & Hoefnagels, J., 15 Mar 2019, In : Scripta Materialia. 162, p. 266-271 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Electron diffraction
diffraction patterns
electron counters
Crystal orientation
Diffraction patterns
7 Citations (Scopus)

Preventing damage and redeposition during focused ion beam milling: the “umbrella” method

Vermeij, T., Plancher, E. & Tasan, C. C., 1 Mar 2018, In : Ultramicroscopy. 186, p. 35-41 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Focused ion beams
ion beams
Electron diffraction
angular resolution
9 Downloads (Pure)
Open Access
Soldering alloys
Scanning electron microscopy
Physical vapor deposition

Can we use electrons to measure local stresses in polycrystalline materials?

Vermeij, T. & Hoefnagels, J. P. M., 13 Dec 2018.

Research output: Contribution to conferencePosterAcademic

Open Access


Best MSc Thesis Award of 2018

Tijmen Vermeij (Recipient), 29 Jul 2019

Prize: OtherCareer, activity or publication related prizes (lifetime, best paper, poster etc.)Scientific