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Siavash Maraghechi

  • 12 Citations
20142019
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Scanning electron microscopy Engineering & Materials Science
artifacts Physics & Astronomy
Scanning Engineering & Materials Science
Electron microscopes Engineering & Materials Science
Imaging techniques Engineering & Materials Science
scanning electron microscopy Physics & Astronomy
shift Physics & Astronomy
Pixels Engineering & Materials Science

Research Output 2014 2019

  • 12 Citations
  • 3 Article
  • 2 Poster
  • 1 Phd Thesis 1 (Research TU/e / Graduation TU/e)
2 Citations (Scopus)

Correction of scanning electron microscope imaging artifacts in a novel digital image correlation framework

Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J., Rokoš, O. & Geers, M. G. D., Apr 2019, In : Experimental Mechanics. 59, 4, p. 489-516 28 p.

Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
Electron microscopes
Scanning
Imaging techniques
Scanning electron microscopy
Pixels

Experimental full-field assessment of kinematical and imaging fluctuation patterns

Maraghechi, S., 6 Dec 2019, (Accepted/In press) Eindhoven: Technische Universiteit Eindhoven. 137 p.

Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e) › Academic

Open Access
File

Experimental full-scale analysis of size effects in cellular elastomeric metamaterials

Maraghechi, S., Hoefnagels, J., Peerlings, R., Rokos, O. & Geers, M., 2019, (In preparation) In : Extreme Mechanics Letters.

Research output: Contribution to journal › Article › Academic

Metamaterials
Buckling
Boundary layers
Computer simulation
Kinematics
10 Citations (Scopus)

Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation framework

Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J. & Geers, M. G. D., 1 Apr 2018, In : Ultramicroscopy. 187, p. 144-163 20 p.

Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
artifacts
Scanning electron microscopy
scanning electron microscopy
shift
Dacarbazine

SEM image artifacts correction using global digital image correlation

Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J. & Geers, M. G. D., 2016

Research output: Contribution to conference › Poster › Academic