Siavash Maraghechi

Former Doctoral Candidate, Department of Mechanical Engineering, Mechanics of Materials
Department of Mechanical Engineering, Hoefnagels

EmailS.Maraghechi@tue.nl

14 Citations

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Scanning electron microscopy Engineering & Materials Science

Metamaterials Engineering & Materials Science

Buckling Engineering & Materials Science

artifacts Physics & Astronomy

Scanning Engineering & Materials Science

Electron microscopes Engineering & Materials Science

Imaging techniques Engineering & Materials Science

Boundary layers Engineering & Materials Science

Research Output 2014 2019

14 Citations
3 Article
2 Poster
1 Phd Thesis 1 (Research TU/e / Graduation TU/e)

3 Citations (Scopus)

36 Downloads (Pure)

Correction of scanning electron microscope imaging artifacts in a novel digital image correlation framework

Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J., Rokoš, O. & Geers, M. G. D., Apr 2019, In : Experimental Mechanics. 59, 4, p. 489-516 28 p.

Research output: Contribution to journal › Article › Academic › peer-review

Open Access

File

Electron microscopes

Scanning

Imaging techniques

Scanning electron microscopy

Pixels

Experimental full-field assessment of kinematical and imaging fluctuation patterns

Maraghechi, S., 6 Dec 2019, Eindhoven: Technische Universiteit Eindhoven. 137 p.

Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)

Open Access

File

Experimental full-scale analysis of size effects in cellular elastomeric metamaterials

Maraghechi, S., Hoefnagels, J., Peerlings, R., Rokos, O. & Geers, M., 16 Oct 2019, (In preparation) In : Extreme Mechanics Letters.

Research output: Contribution to journal › Article › Academic

Metamaterials

Buckling

Boundary layers

Computer simulation

Kinematics

11 Citations (Scopus)

107 Downloads (Pure)

Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation framework

Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J. & Geers, M. G. D., 1 Apr 2018, In : Ultramicroscopy. 187, p. 144-163 20 p.

Research output: Contribution to journal › Article › Academic › peer-review

Open Access

File

artifacts

Scanning electron microscopy

scanning electron microscopy

shift

Dacarbazine

SEM image artifacts correction using global digital image correlation

Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J. & Geers, M. G. D., 2016.

Research output: Contribution to conference › Poster › Academic