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Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 5 Similar Profiles
Nanowires Engineering & Materials Science
nanowires Physics & Astronomy
Molecular beam epitaxy Engineering & Materials Science
Atoms Engineering & Materials Science
Tomography Engineering & Materials Science
molecular beam epitaxy Physics & Astronomy
Impurities Engineering & Materials Science
insulators Physics & Astronomy

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Research Output 2015 2019

1 Citation (Scopus)

Bottom-up grown 2D InSb nanostructures

Gazibegovic, S., Badawy, G., Buckers, T. L. J., Leubner, P., Shen, J., de Vries, F. K., Koelling, S., Kouwenhoven, L. P., Verheijen, M. A. & Bakkers, E. P. A. M., 1 Jan 2019, (Accepted/In press) In : Advanced Materials. 1808181

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
Nanostructures
Nanowires
Electron gas
Carrier mobility
Substrates
4 Citations (Scopus)

Anti-stiction coating for mechanically tunable photonic crystal devices

Petruzzella, M., Zobenica, Cotrufo, M., Zardetto, V., Mameli, A., Pagliano, F., Koelling, S., Van Otten, F. W. M., Roozeboom, F., Kessels, W. M. M., van der Heijden, R. W. & Fiore, A., 19 Feb 2018, In : Optics Express. 26, 4, p. 3882-3891 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
stiction
photonics
coatings
atomic layer epitaxy
frequency modulation
3 Citations (Scopus)

Critical strain for Sn incorporation into spontaneously graded Ge/GeSn core/shell nanowires

Albani, M., Assali, S., Verheijen, M. A., Koelling, S., Bergamaschini, R., Pezzoli, F., Bakkers, E. P. A. M. & Miglio, L., 21 Apr 2018, In : Nanoscale. 10, 15, p. 7250-7256 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Nanowires
Electron diffraction
Spectroscopy
Finite element method
X rays
3 Citations (Scopus)

Efficient green emission from wurtzite AlxIn1-xP nanowires

Gagliano, L., Kruijsse, M., Schefold, J. D. D., Belabbes, A., Verheijen, M. A., Meuret, S., Koelling, S., Polman, A., Bechstedt, F., Haverkort, J. E. M. & Bakkers, E. P. A. M., 12 Feb 2018, In : Nano Letters. 18, 3543-3549

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
wurtzite
Nanowires
nanowires
Light emitting diodes
Energy gap
1 Citation (Scopus)

Industrial application of atom probe tomography to semiconductor devices

Giddings, A. D., Koelling, S., Shimizu, Y., Estivill, R., Inoue, K., Vandervorst, W. & Yeoh, W. K., 15 Apr 2018, In : Scripta Materialia. 148, p. 82-90 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Semiconductor devices
semiconductor devices
Industrial applications
Tomography
tomography