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Personal profile
Academic background
Roel Maes holds an MSc (2007) and PhD (2012) degree in Electrical Engineering from the University of Leuven (KU Leuven, BE). He did his PhD research in the Computer Security and Industrial Cryptography lab (COSIC) at the department of Electrical Engineering (ESAT) at KU Leuven, on the topic of Physically Unclonable Functions, under the supervision of prof. Ingrid Verbauwhede. Since 2012, Roel works as a security architect at Intrinsic ID (Eindhoven, NL), and since 2022, he is affiliated with the ICT Lab at the TUe as a University Researcher.
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
External positions
Principal Security Architect, Intrinsic-ID B.V.
1 Sept 2012 → …
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Collaborations and top research areas from the last five years
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Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes
Masoumian, S., Maes, R., Wang, R., Yerriswamy, K. K., Schrijen, G. J., Hamdioui, S. & Taouil, M., 22 Nov 2023, 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration, VLSI-SoC 2023. Institute of Electrical and Electronics Engineers, 6 p. 10321895Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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Early RTL Analysis for SCA Vulnerability in Fuzzy Extractors of Memory-Based PUF Enabled Devices
Lai, X., Jenihhin, M., Selimis, G., Goossens, S., Maes, R. & Paul, K., 10 Feb 2021, 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration, VLSI-SOC 2020. Institute of Electrical and Electronics Engineers, p. 16-21 6 p. 9344071Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
3 Citations (Scopus) -
Long-term Continuous Assessment of SRAM PUF and Source of Random Numbers
Wang, R., Selimis, G., Maes, R. & Goossens, S., 15 Jun 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020. Institute of Electrical and Electronics Engineers, p. 7-12 6 p. 9116353Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
20 Citations (Scopus) -
Modeling Static Noise Margin for FinFET based SRAM PUFs
Masoumian, S., Selimis, G., Maes, R., Schrijen, G.-J., Hamdioui, S. & Taouil, M., 2 Jul 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers, 6 p. 9131583Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
5 Citations (Scopus) -
RESCURE: A security solution for IoT life cycle
Selimis, G., Wang, R., Maes, R., Schrijen, G. J., Münzer, M., Ilić, S., Willems, F. M. J. & Kusters, L., 25 Aug 2020, Proceedings of the 15th International Conference on Availability, Reliability and Security, ARES 2020. Association for Computing Machinery, Inc., p. 1-10 10 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
1 Citation (Scopus)