• 0 Citations
20182019
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Fingerprint Dive into the research topics where L.M.A. (Loek) Tonnaer is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Image analysis Engineering & Materials Science

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Research Output 2018 2019

  • 1 Conference contribution
  • 1 Paper

Anomaly detection for visual quality control of 3D-printed products

Tonnaer, L., Li, J., Osin, V., Holenderski, M. & Menkovski, V., 1 Jul 2019, 2019 International Joint Conference on Neural Networks, IJCNN 2019. Piscataway: Institute of Electrical and Electronics Engineers, 8852372

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Quality control
Defects
Surface defects
Image resolution

Anomaly detection for imbalanced datasets with deep generative models

Santos Buitrago, N. R., Tonnaer, L. M. A., Menkovski, V. & Mavroeidis, D., 8 Sep 2018 15 p.

Research output: Contribution to conferencePaperAcademic

Open Access
File
Image analysis

Student theses

Active learning in VAE latent space

Author: Tonnaer, L., 25 Sep 2017

Supervisor: Menkovski, V. (Supervisor 1), Portegies, J. W. (Supervisor 2) & Holenderski, M. (Supervisor 2)

Student thesis: Master

File

Drawing symmetrical graphs using group theory

Author: Tonnaer, L., 2014

Student thesis: Bachelor

File