• 0 Citations
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Fingerprint Dive into the research topics where L.M.A. (Loek) Tonnaer is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 1 Similar Profiles
Quality control Engineering & Materials Science
Defects Engineering & Materials Science
Surface defects Engineering & Materials Science
Image resolution Engineering & Materials Science
Image analysis Engineering & Materials Science

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Research Output 2018 2019

  • 1 Conference contribution
  • 1 Paper
2 Downloads (Pure)

Anomaly detection for visual quality control of 3D-printed products

Tonnaer, L., Li, J., Osin, V., Holenderski, M. & Menkovski, V., 1 Jul 2019, 2019 International Joint Conference on Neural Networks, IJCNN 2019. Piscataway: Institute of Electrical and Electronics Engineers, 8 p. 8852372

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Quality control
Surface defects
Image resolution

Anomaly detection for imbalanced datasets with deep generative models

Santos Buitrago, N. R., Tonnaer, L. M. A., Menkovski, V. & Mavroeidis, D., 8 Sep 2018. 15 p.

Research output: Contribution to conferencePaper

Open Access
Image analysis

Student theses

Active learning in VAE latent space

Author: Tonnaer, L., 25 Sep 2017

Supervisor: Menkovski, V. (Supervisor 1), Portegies, J. W. (Supervisor 2) & Holenderski, M. (Supervisor 2)

Student thesis: Master


Drawing symmetrical graphs using group theory

Author: Tonnaer, L., 2014

Student thesis: Bachelor