Projects per year
Personal profile
Research profile
I'm a PhD candidate in the Control Systems Technology (CST) section within Mechanical Engineering. My research focuses on data-driven control, optimal control, and reinforcement learning with an application to Electron Microscopy. I'm interested in contributing to bridging the gap between high-performing methods from artificial intelligence and fundamental theory from systems and control.
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Wir müssen wissen. Wir werden wissen.
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Collaborations and top research areas from the last five years
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22.0024 TKI "Learning in Motion" CST
Ickenroth, T. S. (Project member), Oomen, T. (Project Manager), Steinbuch, M. (Project member), van Hulst, J. (Project member) & Herceg, D. (Project member)
1/01/21 → 29/02/28
Project: Third tier
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AI211006 "ASIMOV" CST
Heemels, W. P. M. H. (Project Manager), Guerreiro Tomé Antunes, D. J. (Project member), van den Eijnden, S. J. A. M. (Project member), van Zuijlen, R. A. C. (Project member), van Hulst, J. (Project member), Scheers, J. M. (Project member) & Oomen, T. (Project member)
1/06/21 → 31/05/24
Project: Third tier
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Learning-Based Calibration, Estimation and Stage Control for Electron Microscopy
van Hulst, J. S., 3 Sept 2026, Eindhoven: Eindhoven University of Technology. 275 p.Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)
Open AccessFile67 Downloads (Pure) -
Smart Exploration in Reinforcement Learning using Bounded Uncertainty Models
van Hulst, J. S., Heemels, W. P. M. H. & Antunes, D. J., 12 Jan 2026, 2025 IEEE 64th Conference on Decision and Control, CDC 2025. Institute of Electrical and Electronics Engineers, p. 5132-5138 7 p. 11313018Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile56 Downloads (Pure) -
Automatic Basis Function Selection in Iterative Learning Control: A Sparsity-Promoting Approach Applied to an Industrial Printer
Ickenroth, T. S. (Corresponding author), van Haren, M., Kon, J. J., van Meer, M., van Hulst, J. & Oomen, T. A. E., 21 Aug 2025, 2025 American Control Conference, ACC 2025. Institute of Electrical and Electronics Engineers, p. 2931-2936 6 p. 11107864Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile1 Link opens in a new tab Citation (Scopus)281 Downloads (Pure) -
Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization
van Hulst, J. (Corresponding author), van Zuijlen, R. A. C., Javaheri, N., Diephuis, M., Antunes, D. J. & Heemels, W. P. M. H., 4 Aug 2025, In: IEEE Access. 13, p. 137291-137302 12 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile124 Downloads (Pure) -
Data-Efficient Quadratic Q-Learning Using LMIs
van Hulst, J., Heemels, W. P. M. H. & Guerreiro Tomé Antunes, D. J., 26 Feb 2025, 2024 63rd IEEE Conference on Decision and Control, CDC 2024. Institute of Electrical and Electronics Engineers, p. 1161-1166 6 p. 10886653Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile212 Downloads (Pure)
Thesis
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Rational Basis Functions to Attenuate Vibrating Flexible Modes with Compensation of Input Nonlinearity: Applied to Semiconductor Wire Bonder
van Hulst, J. S. (Author), Oomen, T. (Supervisor 1), Poot, M. (Supervisor 2), Blanken, L. L. G. (Supervisor 2), Portegies, J. (Supervisor 2), Kostic, D. (External coach) & Yan, K. W. (External coach), 12 Jan 2022Student thesis: Master
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