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Dive into the research topics where Jeroen Middelhuis is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Projects
- 1 Active
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CERTIF-AI: CERTIFication of production process quality through Artificial Intelligence
Dijkman, R. M. (Project Manager), Bukhsh, Z. (Project member), Middelhuis, J. (Project member) & Adan, I. J. B. F. (Project member)
1/05/20 → 15/02/25
Project: Second tier
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Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)
Deenen, P. C. (Corresponding author), Middelhuis, J., Akcay, A. & Adan, I. J. B. F., Jun 2024, In: Flexible Services and Manufacturing Journal. 36, 2, p. 597-598 2 p.Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review
Open AccessFile6 Downloads (Pure) -
Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
Deenen, P. C. (Corresponding author), Middelhuis, J., Akcay, A. & Adan, I. J. B. F., Jun 2024, In: Flexible Services and Manufacturing Journal. 36, 2, p. 567-596 30 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile1 Citation (Scopus)28 Downloads (Pure)
Courses
Press/Media
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Eindhoven University of Technology Reports Findings in Information Technology (Data-driven Aggregate Modeling of a Semiconductor Wafer Fab To Predict Wip Levels and Cycle Time Distributions)
Adan, I. J. B. F., Akcay, A. & Middelhuis, J.
17/07/23
1 item of Media coverage
Press/Media: Expert Comment
Thesis
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Predicting cycle time distributions and work-in-progress levels with aggregate modelling in a real-world wafer fab
Middelhuis, J. (Author), Akçay, A. E. (Supervisor 1), Adan, I. J. B. F. (Supervisor 2) & Martagan, T. G. (Supervisor 2), 31 Aug 2021Student thesis: Master