• 1 Citations
20132019
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Personal profile

Academic background

Enzo Evers received the B.Sc. degree ('14) and M.Sc. degree (cum laude) ('16) in Mechanical Engineering from the Eindhoven University of Technology, Eindhoven, The Netherlands. He is currently pursuing the Ph.D. degree in the Control Systems Technology group within the department of Mechanical Engineering of the Eindhoven University of Technology. His research interest is centered on advanced identification and control for thermal-mechanical systems.

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Parameterization Engineering & Materials Science
Reticle Mathematics
Decentralized control Engineering & Materials Science
Mechatronics Engineering & Materials Science
Time measurement Engineering & Materials Science
Control Design Mathematics
Wafer Mathematics
Controllers Engineering & Materials Science

Research Output 2013 2019

Beyond decentralized wafer/reticle stage control design: A double-Youla approach for enhancing synchronized motion

Evers, E., van de Wal, M. & Oomen, T., Feb 2019, In : Control Engineering Practice. 83, p. 21-32

Research output: Contribution to journalArticleAcademicpeer-review

Reticle
Control Design
Wafer
Decentralized
Subsystem

Improved Local Rational Method by incorporating system knowledge: with application to mechanical and thermal dynamical systems

Evers, E., de Jager, B. & Oomen, T., 1 Jan 2018, In : IFAC-PapersOnLine. 51, 15, p. 808-813 6 p.

Research output: Contribution to journalConference articleAcademicpeer-review

Open Access
Mechatronics
Time measurement
Frequency response
Poles
Dynamical systems
Open Access
File

Synchronized motion control for overall performance enhancement : a Youla framework applied to a wafer scanner

Evers, E., van de Wal, M. M. J. & Oomen, T. A. E., 2017, 36th Benelux Meeting on Systems and Control, 28-30 March 2017, Spa, Belgium. p. 72

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
1 Citations

Synchronizing decentralized control loops for overall performance enhancement : a Youla framework applied to a wafer scanner

Evers, E., van de Wal, M. M. J. & Oomen, T. A. E., 18 Oct 2017, In : IFAC-PapersOnLine. 50, 1, p. 10845-10850

Research output: Contribution to journalConference articleAcademicpeer-review

Open Access
File
Decentralized control
Parameterization
Controllers

Courses

Advanced motion control

1/09/15 → …

Course

Student theses

Synchronized stage motion control: a double-Youla approach to systematic bi-directional controller coupling

Author: Evers, E., 16 Jun 2016

Supervisor: Steinbuch, M. (Supervisor 1), Oomen, T. (Supervisor 2) & van de Wal, M. M. (External coach)

Student thesis: Master