Projects per year
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- 1 Similar Profiles
Collaborations and top research areas from the last five years
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PhoD EHCI 30 Talend and Outreach
Fiore, A. (Project Manager), Saeid, S. (Project member), Walrecht, L. (Project member), Hoeven, A.-J. (Project member), Banfi, E. (Project member) & Lunshof, M. (Project member)
1/01/23 → 12/12/28
Project: Third tier
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Zwaartekracht PSN Research Centre for Integrated Nanophotonics
Fiore, A. (Project Manager), Petruzzella, M. (Project member), Curto, A. G. (Project member), Godiksen, R. H. (Project member), Picelli, L. (Project member), Smit, M. (Project member), Al-Daffaie, S. (Project member), Banfi, E. (Project member), van Elst, D. M. J. (Project member), Verstijnen, T. J. F. (Project member), Perez Sosa, M. (Project member), Liang, M. (Project member), van Veldhoven, P. J. (Project member), Pagliano, F. (Project member), Buntinx, S. (Project member), Koenraad, P. M. (Project member) & Silov, A. Y. (Project member)
1/01/14 → 31/03/25
Project: First tier
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An atomically resolved study of droplet epitaxy InAs quantum dots grown on InGa(As,P)/InP by MOVPE for quantum photonic applications
Banfi, E. G. (Corresponding author), Sala, E. M., Gajjela, R. S. R., Heffernan, J. & Koenraad, P. M., 7 Apr 2025, In: Journal of Applied Physics. 137, 13, 12 p., 134401.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile -
Defects, dots, and dopants disclosed by X-STM
Banfi, E. G., 17 Dec 2024, Eindhoven: Eindhoven University of Technology. 140 p.Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)
Open AccessFile59 Downloads (Pure) -
Atomically resolved study of the unpinned GaN (10 1¯ 0) surface by cross-sectional scanning tunneling microscopy
Banfi, E. G. (Corresponding author), Verstijnen, T. J. F., Monroy, E., Flatté, M. E. & Koenraad, P. M., 15 Aug 2023, In: Physical Review B. 108, 8, 9 p., 085304.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile2 Citations (Scopus)27 Downloads (Pure) -
Atomic scale analysis of N dopants in InAs
Verstijnen, T. J. F. (Corresponding author), Tjeertes, D., Banfi, E. G., Zhuang, Q. & Koenraad, P. M., 15 Jul 2023, In: Physical Review B. 108, 4, 10 p., 045302.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile1 Citation (Scopus)46 Downloads (Pure) -
Atomic scale study of Si-doped AlAs by cross-sectional scanning tunneling microscopy and density functional theory
Tjeertes, D. (Corresponding author), Vela, A., Verstijnen, T. J. F., Banfi, E. G., Veldhoven, P. J. V., Menezes, M. G., de Janeiro, U. F. D., Koiller, B. & Koenraad, P. M., 15 Sept 2021, In: Physical Review B. 104, 12, 10 p., 125433.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile5 Citations (Scopus)185 Downloads (Pure)