Research output per year
Research output per year
dr.ir.
Research activity per year
Ben Rutten is Director Program Board of the Eindhoven AI Systems Institute (EAISI), representing over 200 researchers across 7 faculties working on mobility, health and smart manufacturing research, coordinating inter-disciplinary research initiatives on AI.
Ben Rutten is passionate on new innovations in sustainable transport, health and smart manufacturing. His vision is that self-organising innovation systems enabled by AI, modern wireless technology and mobile Internet applications will revolutionise the transport, health and smart manufacturing innvations in these application areas in a sometimes disruptive manner. Setting up interdisciplinary research teams in international consortia, applying for European funding is a key activity. He is active member of the international EARPA and ARCADE automation working groups and of Eurotech association working group on AI.
Ben Rutten graduated as Mechanical Engineer in 1982 at TU/e and holds since 1995 his PhD on Transportation Technology from Delft University of Technology. He worked for commercial consultancy firms on ICT and sustainable energy on telematics topics, worked as civil servant on program management for sustainable transport systems at Dutch Ministry of Transport and worked for navigation supplier TomTom as program, product and line manager on routing technologies.
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Research output: Contribution to conference › Paper
Research output: Patent › Patent publication
20/03/18
1 item of Media coverage
Press/Media: Expert Comment
30/01/18
1 item of Media coverage
Press/Media: Expert Comment
1/04/16
1 item of Media coverage
Press/Media: Expert Comment
27/01/16
1 item of Media coverage
Press/Media: Expert Comment